In-Field Test for Permanent Faults in FIFO Buffers of NoC Routers

DHANAVATH KIRAN KUMAR NAIK

Abstract


The Network-on-Chip (NoC) communication architecture is a packet based network where cores communicate among themselves by sending and receiving packets. High parallelism, smaller latency in data transmission and facility of Intellectual Property (IP) re-use have made NoCs overcome the problem of bandwidth and latency in conventional bus-based interconnects. In this concise proposes an on-line straightforward test method for recognition of idle hard blames which create in first info initially yield cradles of switches amid field operation of NoC. The strategy includes rehashing tests intermittently to anticipate aggregation of deficiencies. A model execution of the proposed test calculation has been incorporated into the switch channel interface and on-line test has been performed with manufactured self-comparative information movement. The execution of the NoC after expansion of the test circuit has been researched as far as throughput while the region overhead has been examined by incorporating the test equipment. What's more, an on-line test system for the directing rationale has been proposed which considers using the header bounces of the information activity development in transporting the test designs.


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