Novel Correction and Detection for Memory Applications

B. Pujita, S K. Sahir

Abstract


As a result of technology scaling and higher integration densities there may be variations in parameters and noise levels which will lead to larger error rates at various levels of the computations.

Keywords


One step majority logic decoding; error correction codes ECCs; Euclidean geometry low-density parity check EG- LDPC; memory; control logic

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Copyright (c) 2014 B. Pujita, S K. Sahir

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