International Journal of Research

Kumar, V. Naveen, M.Tech. (CSE), AMR Institute of Technology (Affiliated to JNTUH), RR District, Telangana, India., India

• Vol 3, No 4 (2016): Vol-3_Issue-4_February_2016 - Research Articles
  Development of a Suitable Framework for Empirical Evaluation of Pattern Classification Systems to Improve Performance and Enhance Security
  Abstract  PDF