Babu, N. Ramesh, India
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Vol 3, No 17 (2016): Vol-3_Issue-17_November_2016 - Research Articles
Efficient method of Power safe test pattern refinement for transition fault coverage for at Speed Scan based Testing
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All published Articles are Open Access at https://journals.pen2print.org/index.php/ijr/
Paper submission: ijr@pen2print.org